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Presentation 2014-06-02 13:10
[Poster Presentation] Ultra-High Speed Capturing of Dielectric Breakdown of Metal-Oxide-silicon Capacitor up to 10M frame per second
Han Sho, Daiki Kimoto, Kiichi Furukawa, Hidetake sugo, Tohru Takeda, Ken Miyauchi, Yasuhisa Tochigi, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.)
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Reference Info. ITE Tech. Rep., vol. 38, no. 1, IST2014-4, pp. 13-16, June 2014.
Paper # IST2014-4 
Date of Issue 2014-05-26 (IST) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2014-06-02 - 2014-06-02 
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Paper Information
Registration To IST 
Conference Code 2014-06-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Ultra-High Speed Capturing of Dielectric Breakdown of Metal-Oxide-silicon Capacitor up to 10M frame per second 
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1st Author's Name Han Sho  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Daiki Kimoto  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Kiichi Furukawa  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Hidetake sugo  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Tohru Takeda  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
6th Author's Name Ken Miyauchi  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
7th Author's Name Yasuhisa Tochigi  
7th Author's Affiliation Tohoku University (Tohoku Univ.)
8th Author's Name Rihito Kuroda  
8th Author's Affiliation Tohoku University (Tohoku Univ.)
9th Author's Name Shigetoshi Sugawa  
9th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker
Date Time 2014-06-02 13:10:00 
Presentation Time 60 
Registration for IST 
Paper # ITE-IST2014-4 
Volume (vol) ITE-38 
Number (no) no.1 
Page pp.13-16 
#Pages ITE-4 
Date of Issue ITE-IST-2014-05-26 


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