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Presentation 2014-07-04 16:30
Judging Method of Same Circuit Topology
Takayuki Negishi, Masato Kato, Hiroaki Seki, Yoshiki Sugawara, Kento Suzuki, Nobukazu Takai, Haruo Kobayashi (Gunma Univ.)
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(in English) (Not available yet)
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Conference Information
Committee IST IEICE-ICD  
Conference Date 2014-07-03 - 2014-07-04 
Place (in Japanese) (See Japanese page) 
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Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog circuit, Mixed signal, RF and sensor I/F. 
Paper Information
Registration To IEICE-ICD 
Conference Code 2014-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Judging Method of Same Circuit Topology 
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1st Author's Name Takayuki Negishi  
1st Author's Affiliation Gunma University (Gunma Univ.)
2nd Author's Name Masato Kato  
2nd Author's Affiliation Gunma University (Gunma Univ.)
3rd Author's Name Hiroaki Seki  
3rd Author's Affiliation Gunma University (Gunma Univ.)
4th Author's Name Yoshiki Sugawara  
4th Author's Affiliation Gunma University (Gunma Univ.)
5th Author's Name Kento Suzuki  
5th Author's Affiliation Gunma University (Gunma Univ.)
6th Author's Name Nobukazu Takai  
6th Author's Affiliation Gunma University (Gunma Univ.)
7th Author's Name Haruo Kobayashi  
7th Author's Affiliation Gunma University (Gunma Univ.)
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Date Time 2014-07-04 16:30:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
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Volume (vol) vol.38 
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