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Paper Abstract and Keywords
Presentation 2016-08-01 09:15
[Invited Talk] Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2016-08-01 - 2016-08-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Central Electric Club 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To IEICE-ICD 
Conference Code 2016-08-ICD-SDM-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Accelerating the Sensing World through Imaging Evolution 
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1st Author's Name Yusuke Oike  
1st Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions)
2nd Author's Name Hayato Wakabayashi  
2nd Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions)
3rd Author's Name Tetuo Nomoto  
3rd Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions)
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Date Time 2016-08-01 09:15:00 
Presentation Time 45 minutes 
Registration for IEICE-ICD 
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Volume (vol) vol.40 
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