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Paper Abstract and Keywords
Presentation 2016-10-21 14:15
Time Domain Compressed Sensing based Channel Estimation in Fast Fading Channel with Fractional Delay
Ryan Paderna, Duong Quang Thang, Yafei Hou, Takeshi Higashino, Minoru Okada (NAIST)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper evaluates the performance of the proposed compressed sensing (CS) based channel estimator (CE) in fast fading channel with fractional delay. The channel impulse response (CIR) of the fast fading channel with fractional delay is changing over time where the number of impulses is dynamic resulting for the CE to be very complex. Fractional delay is a phenomenon when the receiver and transmitter have mismatch sampling which is very common in time domain CE. The simulation shows that proposed CE was able to estimate the fast fading channel with fractional delay with less error.
Keyword (in Japanese) (See Japanese page) 
(in English) compressed sensing / OFDM / channel estimation / fractional delay / / / /  
Reference Info. ITE Tech. Rep., vol. 40, no. 35, BCT2016-74, pp. 5-8, Oct. 2016.
Paper # BCT2016-74 
Date of Issue 2016-10-14 (BCT) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Committee BCT IEEE-BT  
Conference Date 2016-10-21 - 2016-10-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Aomorishi-Bunka-Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To BCT 
Conference Code 2016-10-BCT-BT 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Time Domain Compressed Sensing based Channel Estimation in Fast Fading Channel with Fractional Delay 
Sub Title (in English)  
Keyword(1) compressed sensing  
Keyword(2) OFDM  
Keyword(3) channel estimation  
Keyword(4) fractional delay  
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1st Author's Name Ryan Paderna  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Duong Quang Thang  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Yafei Hou  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Takeshi Higashino  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
5th Author's Name Minoru Okada  
5th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker
Date Time 2016-10-21 14:15:00 
Presentation Time 25 
Registration for BCT 
Paper # ITE-BCT2016-74 
Volume (vol) ITE-40 
Number (no) no.35 
Page pp.5-8 
#Pages ITE-4 
Date of Issue ITE-BCT-2016-10-14 


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