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Paper Abstract and Keywords
Presentation 2017-03-10 15:40
A high sensitivity and high readout speed electron beam detector using steep pn junction Si diode technology for low acceleration voltage
Rihito Kuroda, Yasumasa Koda, Masaya Hara, Hiroyuki Tsunoda, Shigetoshi Sugawa (Tohoku Univ.)
Abstract (in Japanese) (See Japanese page) 
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Reference Info. ITE Tech. Rep., vol. 41, no. 10, IST2017-18, pp. 39-42, March 2017.
Paper # IST2017-18 
Date of Issue 2017-03-03 (IST) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2017-03-10 - 2017-03-10 
Place (in Japanese) (See Japanese page) 
Place (in English) NHK Research Lab. Auditorium (Setagaya) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Sensor, etc. 
Paper Information
Registration To IST 
Conference Code 2017-03-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A high sensitivity and high readout speed electron beam detector using steep pn junction Si diode technology for low acceleration voltage 
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1st Author's Name Rihito Kuroda  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yasumasa Koda  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Masaya Hara  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Hiroyuki Tsunoda  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Shigetoshi Sugawa  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
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Date Time 2017-03-10 15:40:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2017-18 
Volume (vol) vol.41 
Number (no) no.10 
Page pp.39-42 
#Pages
Date of Issue 2017-03-03 (IST) 


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