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Presentation 2017-11-13 17:20
[Invited Talk] Multi-tap charge modulation CMOS imge sensor and freqyency-domain analysis for range, fluorescence lifetime, and light scattering imaging
Keiichiro Kagawa, Ryota Miyagi, Yuta Murakami, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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(in English) / / / / / / /  
Reference Info. ITE Tech. Rep., vol. 41, no. 37, IST2017-68, pp. 35-40, Nov. 2017.
Paper # IST2017-68 
Date of Issue  
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970

Conference Information
Committee IST  
Conference Date 2017-11-13 - 2017-11-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Morito memorial Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Evolution of CMOS image sensors inspired by emerging applications 
Paper Information
Registration To IST 
Conference Code 2017-11-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Multi-tap charge modulation CMOS imge sensor and freqyency-domain analysis for range, fluorescence lifetime, and light scattering imaging 
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1st Author's Name Keiichiro Kagawa  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Ryota Miyagi  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Yuta Murakami  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
4th Author's Name Keita Yasutomi  
4th Author's Affiliation Shizuoka University (Shizuoka Univ.)
5th Author's Name Shoji Kawahito  
5th Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker
Date Time 2017-11-13 17:20:00 
Presentation Time 30 
Registration for IST 
Paper # ITE-IST2017-68 
Volume (vol) ITE-41 
Number (no) no.37 
Page pp.35-40 
#Pages ITE-6 
Date of Issue  


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