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Paper Abstract and Keywords
Presentation 2018-08-08 12:50
Measurements and Analysis of Power Supply Noise in Digital IC Chip
Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ)
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Conference Information
Committee IST IEICE-ICD IEICE-SDM  
Conference Date 2018-08-07 - 2018-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido University M Bldg. M151 
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To IEICE-ICD 
Conference Code 2018-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurements and Analysis of Power Supply Noise in Digital IC Chip 
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1st Author's Name Kosuke Jike  
1st Author's Affiliation Kobe University (Kobe Univ)
2nd Author's Name Akihiro Tsukioka  
2nd Author's Affiliation Kobe University (Kobe Univ)
3rd Author's Name Ryohei Sawada  
3rd Author's Affiliation Kobe University (Kobe Univ)
4th Author's Name Koh Watanabe  
4th Author's Affiliation Kobe University (Kobe Univ)
5th Author's Name Noriyuki Miura  
5th Author's Affiliation Kobe University (Kobe Univ)
6th Author's Name Makoto Nagata  
6th Author's Affiliation Kobe University (Kobe Univ)
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Date Time 2018-08-08 12:50:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
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Volume (vol) vol.42 
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