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Presentation 2018-08-09 13:45
Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array
Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo)
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Conference Information
Committee IST IEICE-ICD IEICE-SDM  
Conference Date 2018-08-07 - 2018-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido University M Bldg. M151 
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Paper Information
Registration To IEICE-SDM 
Conference Code 2018-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array 
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1st Author's Name Tomoko Mizutani  
1st Author's Affiliation The University of Tokyo (Univ. of Tokyo)
2nd Author's Name Kiyoshi Takeuchi  
2nd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
3rd Author's Name Takuya Saraya  
3rd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
4th Author's Name Masaharu Kobayashi  
4th Author's Affiliation The University of Tokyo (Univ. of Tokyo)
5th Author's Name Toshiro Hiramoto  
5th Author's Affiliation The University of Tokyo (Univ. of Tokyo)
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Date Time 2018-08-09 13:45:00 
Presentation Time 25 minutes 
Registration for IEICE-SDM 
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Volume (vol) vol.42 
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