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Paper Abstract and Keywords
Presentation 2018-09-25 15:20
Backside illuminated, three dimensional stacked single photon avalanche diode technology in 45nm CMOS
Yuichiro Yamashita (TSMC), Myung-Jae Lee (EPFL), Augusto Ronchini Ximenes (TUDelft), Preethi Padmanabhan (EPFL), Tzu-Jui Wang,, Kuo-Chin Huang,, Dun-Nian Yaung (TSMC), Edoardo Charbon (EPFL)
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Reference Info. ITE Tech. Rep., vol. 42, no. 30, IST2018-51, pp. 17-20, Sept. 2018.
Paper # IST2018-51 
Date of Issue 2018-09-18 (IST) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970

Conference Information
Committee IST  
Conference Date 2018-09-25 - 2018-09-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Sensor , etc. 
Paper Information
Registration To IST 
Conference Code 2018-09-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Backside illuminated, three dimensional stacked single photon avalanche diode technology in 45nm CMOS 
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1st Author's Name Yuichiro Yamashita  
1st Author's Affiliation Taiwan Semiconductor Manufacturing Company (TSMC)
2nd Author's Name Myung-Jae Lee  
2nd Author's Affiliation Ecole Polytechnique Federale de Lausanne (EPFL)
3rd Author's Name Augusto Ronchini Ximenes  
3rd Author's Affiliation Delft University of Technology (TUDelft)
4th Author's Name Preethi Padmanabhan  
4th Author's Affiliation Ecole Polytechnique Federale de Lausanne (EPFL)
5th Author's Name Tzu-Jui Wang,  
5th Author's Affiliation Taiwan Semiconductor Manufacturing Company (TSMC)
6th Author's Name Kuo-Chin Huang,  
6th Author's Affiliation Taiwan Semiconductor Manufacturing Company (TSMC)
7th Author's Name Dun-Nian Yaung  
7th Author's Affiliation Taiwan Semiconductor Manufacturing Company (TSMC)
8th Author's Name Edoardo Charbon  
8th Author's Affiliation Ecole Polytechnique Federale de Lausanne (EPFL)
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Speaker
Date Time 2018-09-25 15:20:00 
Presentation Time 30 
Registration for IST 
Paper # ITE-IST2018-51 
Volume (vol) ITE-42 
Number (no) no.30 
Page pp.17-20 
#Pages ITE-4 
Date of Issue ITE-IST-2018-09-18 


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