ITE Technical Group Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-02-20 09:30
A Note on Estimation of Deteriorated Regions Based on Anomaly Detection from Rubber Material Microscope Images
Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents an anomaly detection method for estimation of deteriorated regions from rubber material electron microscope images. In order to develop rubber materials with high durability, it is important to clarify the cause of deterioration. Although deterioration of the rubber materials can be observed from electron microscope images, it is difficult to obtain a large number of deteriorated data. Hence, we propose a deteriorated region estimation method using only non-deteriorated images, namely, anomaly detection. The proposed network consists of a recently proposed Deep Autoencoding Gaussian Mixture Model (DAGMM) model which can achieve a dimensionality reduction task and a density estimation task simultaneously. We show the effectiveness of our framework in the task of estimation of deteriorated regions from rubber material electron microscope images.
Keyword (in Japanese) (See Japanese page) 
(in English) Region estimation / anomaly detection / small amount data / deep learning / rubber materials / / /  
Reference Info. ITE Tech. Rep., vol. 43, no. 5, ME2019-49, pp. 265-268, Feb. 2019.
Paper # ME2019-49 
Date of Issue 2019-02-12 (MMS, HI, ME, AIT) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
Download PDF

Conference Information
Committee ME IEICE-IE IEICE-ITS MMS HI AIT  
Conference Date 2019-02-19 - 2019-02-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Processing, etc. 
Paper Information
Registration To ME 
Conference Code 2019-02-ME-IE-ITS-MMS-HI-AIT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Note on Estimation of Deteriorated Regions Based on Anomaly Detection from Rubber Material Microscope Images 
Sub Title (in English)  
Keyword(1) Region estimation  
Keyword(2) anomaly detection  
Keyword(3) small amount data  
Keyword(4) deep learning  
Keyword(5) rubber materials  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ren Togo  
1st Author's Affiliation Graduate School of Information Science and Technology (Hokkaido Univ.)
2nd Author's Name Takahiro Ogawa  
2nd Author's Affiliation Graduate School of Information Science and Technology (Hokkaido Univ.)
3rd Author's Name Miki Haseyama  
3rd Author's Affiliation Graduate School of Information Science and Technology (Hokkaido Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2019-02-20 09:30:00 
Presentation Time 15 minutes 
Registration for ME 
Paper # MMS2019-27, HI2019-27, ME2019-49, AIT2019-27 
Volume (vol) vol.43 
Number (no) no.5 
Page pp.265-268 
#Pages
Date of Issue 2019-02-12 (MMS, HI, ME, AIT) 


[Return to Top Page]

[Return to ITE Web Page]


The Institute of Image Information and Television Engineers (ITE), Japan