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Paper Abstract and Keywords
Presentation 2019-09-19 14:45
A study on the optimal acquisition interval for sample and hold signals
Ryouichi Nishimura (NICT)
Abstract (in Japanese) (See Japanese page) 
(in English) Micro Electro Mechanical Systems (MEMS) sensors are promising for IoT applications because they are small and available at low prices. In general, the data observed by a MEMS sensor is temporarily stored in the register and needs to be read out by the host computer before it is updated. Therefore, a delay in reading register may result in the failure of data extraction. In contrast, reading the register twice before update results in the acquisition of redundant data. Therefore, it is desired that the sampling interval by the host computer exactly equals to the update period of the register. For that reason, estimation methods of this update period are herein discussed which is based on the observed data. To achieve this purpose, consecutive pairs of adjacent observed data are compared and binary values are assigned depending on whether they are equal or not. The obtained data sequence is regarded as a collection of binary random variables. Using this model, the update period is estimated by means of maximum likelihood estimation. Examples of applying this method and another to actual MEMS sensor data are presented.
Keyword (in Japanese) (See Japanese page) 
(in English) sampling interval / maximum likelihood estimation / binomial distribution / MEMS sensor / IoT / / /  
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Conference Information
Committee IEICE-IE IEICE-EMM IEICE-LOIS IEE-CMN ME IPSJ-AVM  
Conference Date 2019-09-19 - 2019-09-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokimeito, Niigata University 
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Paper Information
Registration To IEICE-EMM 
Conference Code 2019-09-IE-EMM-LOIS-CMN-ME-AVM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study on the optimal acquisition interval for sample and hold signals 
Sub Title (in English)  
Keyword(1) sampling interval  
Keyword(2) maximum likelihood estimation  
Keyword(3) binomial distribution  
Keyword(4) MEMS sensor  
Keyword(5) IoT  
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1st Author's Name Ryouichi Nishimura  
1st Author's Affiliation National Institute of Information and Communications Technology (NICT)
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Speaker Author-1 
Date Time 2019-09-19 14:45:00 
Presentation Time 25 minutes 
Registration for IEICE-EMM 
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Volume (vol) vol.43 
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