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Presentation 2020-02-27 15:55
Learning Structural Edges for Deep Patch Depth Prediction
Masaya Kaneko (The Univ. of Tokyo), Ken Sakurada (AIST), Satoshi Ikehata (NII), Kiyoharu Aizawa (The Univ. of Tokyo)
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(in English) (Not available yet)
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Conference Information
Committee HI IEICE-IE IEICE-ITS MMS ME AIT  
Conference Date 2020-02-27 - 2020-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Processing, etc. 
Paper Information
Registration To IEICE-IE 
Conference Code 2020-02-HI-IE-ITS-MMS-ME-AIT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Learning Structural Edges for Deep Patch Depth Prediction 
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1st Author's Name Masaya Kaneko  
1st Author's Affiliation The University of Tokyo (The Univ. of Tokyo)
2nd Author's Name Ken Sakurada  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Satoshi Ikehata  
3rd Author's Affiliation National Institute of Informatics (NII)
4th Author's Name Kiyoharu Aizawa  
4th Author's Affiliation The University of Tokyo (The Univ. of Tokyo)
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Date Time 2020-02-27 15:55:00 
Presentation Time 15 minutes 
Registration for IEICE-IE 
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Volume (vol) vol.44 
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