Paper Abstract and Keywords |
Presentation |
2021-03-26 11:05
A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image Sensor with 45μm-Thick Backside-Illuminated Pinned Photodiode and Two-Stage LOFIC Hiroya Shike, Rihito Kuroda, Ryota Kobayashi, Maasa Murata, Yasuyuki Fujihara, Manabu Suzuki, Shoma Harada (Tohoku Univ.), Taku Shibaguchi, Naoya Kuriyama (LAPIS Semiconductor), Takaki Hatsui (RIKEN), Jun Miyawaki (The Univ. of Tokyo/QST), Tetsuo Harada (Univ. of Hyogo), Yuichi Yamasaki (NIMS), Takeo Watanabe (Univ. of Hyogo), Yoshihisa Harada (The Univ. of Tokyo), Shigetoshi Sugawa (Tohoku Univ.) |
Abstract |
(in Japanese) |
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(in English) |
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Keyword |
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(in English) |
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Reference Info. |
ITE Tech. Rep., vol. 45, no. 11, IST2021-12, pp. 17-20, March 2021. |
Paper # |
IST2021-12 |
Date of Issue |
2021-03-19 (IST) |
ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
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