ITE Technical Group Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2022-03-28 11:35
A branching gate image sensor with a central resistive gate
Takeharu Goji Etoh (Osaka Univ.), Ngo Hoai Nguyen (Ritsumeikan Univ.), Heiji Watanabe (Osaka Univ.), Takayoshi Shimura, Yoshiyuki Matsunaga, Yutaka Hirose (Ritsumeikan Univ.), Hideki Mutoh (Link Research), Kazuhiro Shimonomura (Ritsumeikan Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) A BSI branching gate (multi-tap) image sensor has a wide octagonal center gate at the center of the pixel. Electrons fall from the photodiode distribute over the center gate. They take different times to reach one edge of the center gate, where the potential is higher than those at other edges. The distributed falling positions causes a temporal distribution of the arrival time to the edge and elongate the temporal resolution. An old CCD technology “a resistive gate”, which has a plural of contacts on one electrode, is applied to the center gate to approximately linearize the potential profile along the travel route of the electrons, which minimizes the temporal resolution. The pros and cons of the structure are discussed.
Keyword (in Japanese) (See Japanese page) 
(in English) super temporal resolution / burst image sensor / registive gate / / / / /  
Reference Info. ITE Tech. Rep., vol. 46, no. 14, IST2022-15, pp. 21-24, March 2022.
Paper # IST2022-15 
Date of Issue 2022-03-21 (IST) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
Download PDF

Conference Information
Committee IST  
Conference Date 2022-03-28 - 2022-03-28 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IST 
Conference Code 2022-03-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A branching gate image sensor with a central resistive gate 
Sub Title (in English)  
Keyword(1) super temporal resolution  
Keyword(2) burst image sensor  
Keyword(3) registive gate  
1st Author's Name Takeharu Goji Etoh  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Ngo Hoai Nguyen  
2nd Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
3rd Author's Name Heiji Watanabe  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name Takayoshi Shimura  
4th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
5th Author's Name Yoshiyuki Matsunaga  
5th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
6th Author's Name Yutaka Hirose  
6th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
7th Author's Name Hideki Mutoh  
7th Author's Affiliation Link Research Corporation (Link Research)
8th Author's Name Kazuhiro Shimonomura  
8th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2022-03-28 11:35:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2022-15 
Volume (vol) vol.46 
Number (no) no.14 
Page pp.21-24 
Date of Issue 2022-03-21 (IST) 

[Return to Top Page]

[Return to ITE Web Page]

The Institute of Image Information and Television Engineers (ITE), Japan