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Paper Abstract and Keywords
Presentation 2023-08-03 10:15
[Invited Talk] Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability
Yuta Aiba, Hitomi Tanaka, Hiroki Tanaka, Fumie Kikushima, Toshio Fujisawa, Hideko Mukaida, Tomoya Sanuki (KIOXIA)
Abstract (in Japanese) (See Japanese page) 
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Reference Info. ITE Tech. Rep.
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ISSN Online edition: ISSN 2424-1970
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Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2023-08-01 - 2023-08-03 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IEICE-SDM 
Conference Code 2023-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability 
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1st Author's Name Yuta Aiba  
1st Author's Affiliation KIOXIA Corporation (KIOXIA)
2nd Author's Name Hitomi Tanaka  
2nd Author's Affiliation KIOXIA Corporation (KIOXIA)
3rd Author's Name Hiroki Tanaka  
3rd Author's Affiliation KIOXIA Corporation (KIOXIA)
4th Author's Name Fumie Kikushima  
4th Author's Affiliation KIOXIA Corporation (KIOXIA)
5th Author's Name Toshio Fujisawa  
5th Author's Affiliation KIOXIA Corporation (KIOXIA)
6th Author's Name Hideko Mukaida  
6th Author's Affiliation KIOXIA Corporation (KIOXIA)
7th Author's Name Tomoya Sanuki  
7th Author's Affiliation KIOXIA Corporation (KIOXIA)
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Date Time 2023-08-03 10:15:00 
Presentation Time 45 minutes 
Registration for IEICE-SDM 
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Volume (vol) vol.47 
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