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Paper Abstract and Keywords
Presentation 2024-03-27 15:30
A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout
Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki (SSS), Hidenori Maeda, Kenji Toshima (SCK), Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike (SSS)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper introduces the pixel front-end (PFE) circuit pitch reduction of SPAD photon count image sensor, which was reported at 2023 Symposium on VLSI Technology and Circuits [8]. A SPAD photon count image sensor with 120-dB High Dynamic Range (HDR) at 3.36 µm-pitch was realized. Conventionally, the SPAD photon count image sensor for realizing HDR has been limited to a PFE circuit pitch of about 10 μm, but the counter circuit in PFE circuit of 8 bits was realized by using a clustered multi-cycle clocked recharging (CMCR) technique with intermediate most-significant-bit readout (MSB-Read). Furthermore, the maximum utilization of the fine logic (22 nm) due to the amplitude limitation reduced the PFE circuit pitch.
Keyword (in Japanese) (See Japanese page) 
(in English) CMOS image sensors / photon-counting / ingle-photon avalanche diode / 3D stack / high dynamic range / / /  
Reference Info. ITE Tech. Rep., vol. 48, no. 15, IST2024-21, pp. 42-45, March 2024.
Paper # IST2024-21 
Date of Issue 2024-03-20 (IST) 
ISSN Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2024-03-27 - 2024-03-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IST 
Conference Code 2024-03-IST 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout 
Sub Title (in English)  
Keyword(1) CMOS image sensors  
Keyword(2) photon-counting  
Keyword(3) ingle-photon avalanche diode  
Keyword(4) 3D stack  
Keyword(5) high dynamic range  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takafumi Takatsuka  
1st Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
2nd Author's Name Jun Ogi  
2nd Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
3rd Author's Name Yasuji Ikeda  
3rd Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
4th Author's Name Kazuki Hizu  
4th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
5th Author's Name Yutaka Inaoka  
5th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
6th Author's Name Shunsuke Sakama  
6th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
7th Author's Name Iori Watanabe  
7th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
8th Author's Name Tatsuya Ishikawa  
8th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
9th Author's Name Shohei Shimada  
9th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
10th Author's Name Junki Suzuki  
10th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
11th Author's Name Hidenori Maeda  
11th Author's Affiliation Sony Semiconductor Manufacturing Corporation (SCK)
12th Author's Name Kenji Toshima  
12th Author's Affiliation Sony Semiconductor Manufacturing Corporation (SCK)
13th Author's Name Yusuke Nonaka  
13th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
14th Author's Name Akifumi Yamamura  
14th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
15th Author's Name Hideki Ozawa  
15th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
16th Author's Name Fumihiko Koga  
16th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
17th Author's Name Yusuke Oike  
17th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2024-03-27 15:30:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2024-21 
Volume (vol) vol.48 
Number (no) no.15 
Page pp.42-45 
#Pages
Date of Issue 2024-03-20 (IST) 


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