ITE Technical Group Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-06-06 13:30
Fabrication of high-quality α"-Fe16N2 thin film with high saturation magnetization using pulsed DC reactive sputtering method
Ikuko Katsuyama, Genta Egawa, Satoru Yoshimura (Akita Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) An α"-Fe16N2 has very high saturation magnetization and as the result very high magnetic crystalline anisotropy energy even if magnetic anisotropy field is not so large. Therefore, magnetization switching field of this material is smaller than that of L10-FePt which has very high magnetic crystalline anisotropy energy and very high magnetic anisotropy field. As the results, α"-Fe16N2 seems one of the suitable materials for next-generation high density magnetic recording media without energy assisted recording system. In this study, for fabrication of α"-Fe16N2 thin films, we newly attempted a Pulsed DC (P-DC) Reactive Sputtering method, which is expected to provide high quality in the formation of oxide/nitride thin films with complex crystal structures. We investigated the influence of film composition on deposition parameters such as pulse frequency, deposition power, and target-substrate (T-S) distance. As a result, with decreasing pulse frequency, with increasing deposition power, and with decreasing T-S distance, nitrogen concentration in the thin film decreased, and it was clear that the optimized deposition conditions to obtain the nitrogen concentration of about Fe:N ≈ 16:2 in the thin film were pulse frequency: 25 kHz, deposition power: 200 W, and T-S distance: 100 mm, respectively. Using these deposition conditions, we investigated the deposition temperature and VHF plasma irradiation to promote the α" phase formation and crystallization in the fabrication of Fe-N thin films on MgO(100) single crystalline substrates. As a result, it was found that α" phase formation and crystallization were most enhanced at a deposition temperature of 200℃ and a VHF plasma irradiation voltage of -18 to -16 V. Moreover, by comparing to Fe-N thin films fabricated by using a P-DC power source and normal DC power source, reactive P-DC sputtering method was found to have a positive impact on α" phase formation and crystallization.
Keyword (in Japanese) (See Japanese page) 
(in English) α"-Fe16N2 / Pulsed DC reactive sputtering / VHF plasma irradiation / Saturation magnetization / Recoding media / / /  
Reference Info. ITE Tech. Rep., vol. 48, no. 18, MMS2024-31, pp. 1-8, June 2024.
Paper # MMS2024-31 
Date of Issue 2024-05-30 (MMS) 
ISSN Online edition: ISSN 2424-1970
Download PDF

Conference Information
Committee IEICE-MRIS MMS  
Conference Date 2024-06-06 - 2024-06-07 
Place (in Japanese) (See Japanese page) 
Place (in English) RIEC, Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Recording system, Head, Media, and Others 
Paper Information
Registration To MMS 
Conference Code 2024-06-MRIS-MMS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fabrication of high-quality α"-Fe16N2 thin film with high saturation magnetization using pulsed DC reactive sputtering method 
Sub Title (in English)  
Keyword(1) α"-Fe16N2  
Keyword(2) Pulsed DC reactive sputtering  
Keyword(3) VHF plasma irradiation  
Keyword(4) Saturation magnetization  
Keyword(5) Recoding media  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ikuko Katsuyama  
1st Author's Affiliation Akita University (Akita Univ.)
2nd Author's Name Genta Egawa  
2nd Author's Affiliation Akita University (Akita Univ.)
3rd Author's Name Satoru Yoshimura  
3rd Author's Affiliation Akita University (Akita Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-3 
Date Time 2024-06-06 13:30:00 
Presentation Time 25 minutes 
Registration for MMS 
Paper # MMS2024-31 
Volume (vol) vol.48 
Number (no) no.18 
Page pp.1-8 
#Pages
Date of Issue 2024-05-30 (MMS) 


[Return to Top Page]

[Return to ITE Web Page]


The Institute of Image Information and Television Engineers (ITE), Japan