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Presentation 2024-08-02 14:55
[Invited Talk] Breakthrough for Test Cost Reduction on Micro-LED Device with High Parallel Single Insertion Testing of Electric-Luminescence including External Quantum Efficiency and Electrical Test
Kotaro Hasegawa, Koji Mitauchi, Hiroshi Kaga (ADVANTEST)
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Reference Info. ITE Tech. Rep., vol. 48, no. 25, IDY2024-28, pp. 16-16, Aug. 2024.
Paper # IDY2024-28 
Date of Issue 2024-07-26 (IDY) 
ISSN Online edition: ISSN 2424-1970
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Conference Information
Committee IDY IEICE-EID SID-JC  
Conference Date 2024-08-02 - 2024-08-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
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Paper Information
Registration To IDY 
Conference Code 2024-08-IDY-EID-JC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Breakthrough for Test Cost Reduction on Micro-LED Device with High Parallel Single Insertion Testing of Electric-Luminescence including External Quantum Efficiency and Electrical Test 
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1st Author's Name Kotaro Hasegawa  
1st Author's Affiliation ADVANTEST CORPORATION (ADVANTEST)
2nd Author's Name Koji Mitauchi  
2nd Author's Affiliation ADVANTEST CORPORATION (ADVANTEST)
3rd Author's Name Hiroshi Kaga  
3rd Author's Affiliation ADVANTEST CORPORATION (ADVANTEST)
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Date Time 2024-08-02 14:55:00 
Presentation Time 25 minutes 
Registration for IDY 
Paper # IDY2024-28 
Volume (vol) vol.48 
Number (no) no.25 
Page p.16 
#Pages
Date of Issue 2024-07-26 (IDY) 


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