ITE Technical Group Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-08-05 16:35
Study on wave length measurement based ADC for resistive sensing
Yoshihiro Komatsu, Takuto Togashi, xiaochi shen, Masayuki Ikebe (Hokkaido Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) Various types of sensors using resistance change exist, including pressure sensors, acceleration sensors, smell sensors, and bolometer-type far-infrared image sensors. A/D conversion in resistance change array sensors involves converting the current generated by the application of a constant voltage into a digital value. VCO-ADC or integrating type ADC is the main method of A/D conversion using current. VCO-ADC has a constant measurement time but is characterized by a large quantization error. On the other hand, an integrating ADC provides high measurement accuracy but is not suitable for high-speed conversion because the measurement range is proportional to the measurement time. By combining these two ADCs, we propose an A/D converter with high speed, high accuracy, and wide dynamic range.
Keyword (in Japanese) (See Japanese page) 
(in English) Resistive sensor / VCO-ADC / integration ADC / quantization error / / / /  
Reference Info. ITE Tech. Rep., vol. 48, no. 26, IST2024-40, pp. 10-13, Aug. 2024.
Paper # IST2024-40 
Date of Issue 2024-07-29 (IST) 
ISSN Online edition: ISSN 2424-1970
Download PDF

Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2024-08-05 - 2024-08-07 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IST 
Conference Code 2024-08-ICD-SDM-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on wave length measurement based ADC for resistive sensing 
Sub Title (in English)  
Keyword(1) Resistive sensor  
Keyword(2) VCO-ADC  
Keyword(3) integration ADC  
Keyword(4) quantization error  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshihiro Komatsu  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Takuto Togashi  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name xiaochi shen  
3rd Author's Affiliation Hokkaido University (Hokkaido Univ.)
4th Author's Name Masayuki Ikebe  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2024-08-05 16:35:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2024-40 
Volume (vol) vol.48 
Number (no) no.26 
Page pp.10-13 
#Pages
Date of Issue 2024-07-29 (IST) 


[Return to Top Page]

[Return to ITE Web Page]


The Institute of Image Information and Television Engineers (ITE), Japan