| Paper Abstract and Keywords |
| Presentation |
2025-08-08 10:50
Closed-Loop Active Gate Driver IC With Integrated Sensing Functions for IGBTs
Yaogan Liang, Yohei Sukita, Michihiro Ide, Makoto Takamiya (The Univ. of Tokyo) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In order to reduce the switching loss (ELOSS) of power devices at different load current (IL) conditions, a closed-loop active gate driver (AGD) IC for IGBTs with novel integrated sensing functions is proposed to automatically optimize the gate driving pattern as IL changes. The proposed AGD IC can change gate current when the collector current equals IL by sensing and integrating the induced voltage between the Kelvin emitter and power emitter terminals during switching transient. In the switching measurements of IGBTs at 600 V using AGD IC fabricated with 180 nm BCD process, compared with the conventional single-step gate driving, the proposed AGD reduces ELOSS by 20%, 24%, and 27% at IL of 50 A, 75 A, and 100 A, respectively. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
active gate driver / switching loss / closed-loop / / / / / |
| Reference Info. |
ITE Tech. Rep. |
| Paper # |
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| Date of Issue |
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| ISSN |
Online edition: ISSN 2424-1970 |
| Download PDF |
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| Conference Information |
| Committee |
IEICE-SDM IEICE-ICD IST |
| Conference Date |
2025-08-06 - 2025-08-08 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Hokkaido Univ. Prmaceutical of Science |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
| Paper Information |
| Registration To |
IEICE-ICD |
| Conference Code |
2025-08-SDM-ICD-IST |
| Language |
English |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Closed-Loop Active Gate Driver IC With Integrated Sensing Functions for IGBTs |
| Sub Title (in English) |
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| Keyword(1) |
active gate driver |
| Keyword(2) |
switching loss |
| Keyword(3) |
closed-loop |
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| 1st Author's Name |
Yaogan Liang |
| 1st Author's Affiliation |
The University of Tokyo (The Univ. of Tokyo) |
| 2nd Author's Name |
Yohei Sukita |
| 2nd Author's Affiliation |
The University of Tokyo (The Univ. of Tokyo) |
| 3rd Author's Name |
Michihiro Ide |
| 3rd Author's Affiliation |
The University of Tokyo (The Univ. of Tokyo) |
| 4th Author's Name |
Makoto Takamiya |
| 4th Author's Affiliation |
The University of Tokyo (The Univ. of Tokyo) |
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| Speaker |
Author-1 |
| Date Time |
2025-08-08 10:50:00 |
| Presentation Time |
25 minutes |
| Registration for |
IEICE-ICD |
| Paper # |
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| Volume (vol) |
vol.49 |
| Number (no) |
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| Page |
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