| Conference Information |
| Committee |
IIEEJ AIT |
| Conference Date |
2026-06-22 - 2026-06-23 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Waseda Univ. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
AIT |
| Conference Code |
2026-06-IIEEJ-AIT |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A Machine Learning-Based Quality Metric for Tone-Mapped Arc Welding Images |
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| 1st Author's Name |
Tomohiro Katagiri |
| 1st Author's Affiliation |
Tokyo City University (TCU) |
| 2nd Author's Name |
Yuya Okamoto |
| 2nd Author's Affiliation |
Kawada Technologies, Inc. (KAWADA) |
| 3rd Author's Name |
Yoshisuke Tateyama |
| 3rd Author's Affiliation |
Kawada Technologies, Inc. (KAWADA) |
| 4th Author's Name |
Noriyuki Kanehira |
| 4th Author's Affiliation |
Kawada Technologies, Inc. (KAWADA) |
| 5th Author's Name |
Youngha Chang |
| 5th Author's Affiliation |
Tokyo City University (TCU) |
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| Speaker |
Author-1 |
| Date Time |
2026-06-23 11:20:00 |
| Presentation Time |
20 minutes |
| Registration for |
AIT |
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| Volume (vol) |
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