| Paper Abstract and Keywords |
| Presentation |
2026-08-25 10:20
Study on the Efficient Application of SAM to SEM Image Analysis of Sintered Alumina
Seki Nanoha, Yuya Akiba, Takashi Murakami, Kimiya Aoki (Chukyo Univ.), Yuki Nakashima, Kiyoshi Hirao, Manabu Fukushima (NEDO) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Process informatics (PI) for next‑generation ceramics development requires accurate characterization of microstructural distributions. However, manually annotating the large number of particles contained in SEM images is extremely time‑consuming and has become a major bottleneck in the development workflow. In this study, we propose an adjacent‑particle prediction method that leverages the geometric constraint of particle connectivity to resolve the trade‑off between computational efficiency and segmentation accuracy in the Segment Anything Model (SAM), a general‑purpose segmentation framework. Starting from a user‑specified particle, the method sequentially predicts neighboring particles and expands the search region using breadth‑first search (BFS). Experiments demonstrate that the proposed approach reduces processing time and decreases the number of missed particles compared with SAM’s standard automatic mask generation. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Segment Anything Model / SEM image / neighboring particle prediction / / / / / |
| Reference Info. |
ITE Tech. Rep., vol. 50, pp. 59-61, Aug. 2026. |
| Paper # |
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| Date of Issue |
2026-08-17 (ME) |
| ISSN |
Online edition: ISSN 2424-1970 |
| Download PDF |
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| Conference Information |
| Committee |
ME JSPE-IAIP |
| Conference Date |
2026-08-24 - 2026-08-25 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Nagoya Kasadera Hotel |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
JSPE-IAIP |
| Conference Code |
2026-08-ME-IAIP |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Study on the Efficient Application of SAM to SEM Image Analysis of Sintered Alumina |
| Sub Title (in English) |
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| Keyword(1) |
Segment Anything Model |
| Keyword(2) |
SEM image |
| Keyword(3) |
neighboring particle prediction |
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| Keyword(5) |
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| 1st Author's Name |
Seki Nanoha |
| 1st Author's Affiliation |
Chukyo University (Chukyo Univ.) |
| 2nd Author's Name |
Yuya Akiba |
| 2nd Author's Affiliation |
Chukyo University (Chukyo Univ.) |
| 3rd Author's Name |
Takashi Murakami |
| 3rd Author's Affiliation |
Chukyo University (Chukyo Univ.) |
| 4th Author's Name |
Kimiya Aoki |
| 4th Author's Affiliation |
Chukyo University (Chukyo Univ.) |
| 5th Author's Name |
Yuki Nakashima |
| 5th Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (NEDO) |
| 6th Author's Name |
Kiyoshi Hirao |
| 6th Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (NEDO) |
| 7th Author's Name |
Manabu Fukushima |
| 7th Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (NEDO) |
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| Speaker |
Author-1 |
| Date Time |
2026-08-25 10:20:00 |
| Presentation Time |
55 minutes |
| Registration for |
JSPE-IAIP |
| Paper # |
ME2026-71 |
| Volume (vol) |
vol.50 |
| Number (no) |
no.23 |
| Page |
pp.59-61 |
| #Pages |
3 |
| Date of Issue |
2026-08-17 (ME) |