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Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IEICE-EID, IDY, IEE-EDD |
2012-01-28 10:18 |
Akita |
Akita University |
High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno (Tohoku Univ.), Tetsuya Miyashita (Tohoku Inst. of Tech), Tatsuo Uchida (Sendai Nat. College of Tech) |
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IDY, IEICE-EID, IEE-EDD, IEIJ-OMD |
2011-01-29 09:25 |
Kochi |
Kochi University of Technology |
Analysis of Complex Refractive Index of Polarizer by Ellipsometry Tsutomu Kondo, Takahiro Ishinabe, Tetsuya Miyashita (Tohoku Univ.), Tatsuo Uchida (SNCT) |
Improvement of the optical performance of polarizer has become important problem for the improvement of brightness and c... [more] |
IDY2011-7 pp.69-72 |
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