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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2015-05-08
Tokyo   Effect of random telegraph noise reduction by atomically flat gate insulator film/Si interface
Rihito Kuroda, Toshiki Obara, Tetsuya Goto, Naoya Akagawa, Daiki Kimoto, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.)
 [more] IST2015-33
IST 2014-03-14
Tokyo NHK A Statistical Analysis of Dependencies of Random Telegraph Noise Time Constants on Operation Conditions
Rihito Kuroda, Akihiro Yonezawa, Toshiki Obara, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.)
 [more] IST2014-12
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