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Paper #
IST
2010-09-27
16:30
Tokyo
Kikai-Shinko-Kaikan Bldg.
Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe
,
Akinobu Teramoto
,
Shigetoshi Sugawa
,
Tadahiro Ohmi
(
Tohoku Univ.
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Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image...
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IST2010-47
pp.29-32
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