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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST, IEICE-ICD, IEICE-SDM 2018-08-09
12:45
Hokkaido Hokkaido University M Bldg. M151 Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas)
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