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All Technical Committee Conferences (Searched in: Recent 10 Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-IE, IEICE-ITS, MMS, ME, AIT [detail] |
2021-02-18
14:50 |
Online |
Online |
A Note on Estimation of Deteriorated Regions Based on Anomaly Detection from Rubber Material Electron Microscope Images
-- Verification of Feature Representations Extracted from Deep Learning Models --
Masanao Matsumoto, Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ) |
This paper presents an anomaly detection method for estimation of deteriorated regions from rubber material electron mic... [more] |
MMS2021-9 ME2021-9 AIT2021-9
pp.43-46 |
| HI, IEICE-IE, IEICE-ITS, MMS, ME, AIT [detail] |
2020-02-27
14:40 |
Hokkaido |
Hokkaido Univ.
(Cancelled) |
A Note on Eye Gaze Based User-specific Interest Estimation for Images
-- Estimation Performance Improvement Based on sMVCCA including Ordinal Label Dequantization --
Masanao Matsumoto (Hokkaido Univ.), Naoki Saito (NIT, Kushiro College), Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
This paper presents supervised multiview canonical correlation analysis via ordinal label dequantization (sMVCCA-OLD) fo... [more] |
MMS2020-15 HI2020-15 ME2020-43 AIT2020-15
pp.73-77 |
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