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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2010-09-27
16:30
Tokyo Kikai-Shinko-Kaikan Bldg. Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.)
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] IST2010-47
pp.29-32
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