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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-EID, IDY, IEE-EDD 2012-01-28
10:18
Akita Akita University High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis
Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno (Tohoku Univ.), Tetsuya Miyashita (Tohoku Inst. of Tech), Tatsuo Uchida (Sendai Nat. College of Tech)
 [more]
IDY, IEICE-EID, IEE-EDD, IEIJ-OMD 2011-01-29
09:25
Kochi Kochi University of Technology Analysis of Complex Refractive Index of Polarizer by Ellipsometry
Tsutomu Kondo, Takahiro Ishinabe, Tetsuya Miyashita (Tohoku Univ.), Tatsuo Uchida (SNCT)
Improvement of the optical performance of polarizer has become important problem for the improvement of brightness and c... [more] IDY2011-7
pp.69-72
IST 2010-11-19
13:45
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Recent progress on display technology and expectation for image sensor technology
Tetsuya Miyashita (Tohoku Univ.)
 [more] IST2010-64
pp.9-15
3DIT, IDY 2009-10-21
15:30
Tokyo NHK STRL New Method for Eliminating Pseudoscopy in Multiview 3D Displays
Jaeyong Lee, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.)
Flat-Panel Multi-view 3D Displays have been developed actively in recent years. But these displays have some pseudoscopi... [more] IDY2009-100 3DIT2009-74
pp.37-40
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