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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IEICE-EID, IDY, IEE-EDD |
2012-01-28 10:18 |
Akita |
Akita University (Akita) |
High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno (Tohoku Univ.), Tetsuya Miyashita (Tohoku Inst. of Tech), Tatsuo Uchida (Sendai Nat. College of Tech) |
[more] |
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IDY, IEICE-EID, IEE-EDD, IEIJ-OMD |
2011-01-29 09:25 |
Kochi |
Kochi University of Technology (Kochi) |
Analysis of Complex Refractive Index of Polarizer by Ellipsometry Tsutomu Kondo, Takahiro Ishinabe, Tetsuya Miyashita (Tohoku Univ.), Tatsuo Uchida (SNCT) |
Improvement of the optical performance of polarizer has become important problem for the improvement of brightness and c... [more] |
IDY2011-7 pp.69-72 |
IST |
2010-11-19 13:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
[Invited Talk]
Recent progress on display technology and expectation for image sensor technology Tetsuya Miyashita (Tohoku Univ.) |
[more] |
IST2010-64 pp.9-15 |
3DMT, IDY |
2009-10-21 15:30 |
Tokyo |
NHK STRL (Tokyo) |
New Method for Eliminating Pseudoscopy in Multiview 3D Displays Jaeyong Lee, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.) |
Flat-Panel Multi-view 3D Displays have been developed actively in recent years. But these displays have some pseudoscopi... [more] |
IDY2009-100 3DIT2009-74 pp.37-40 |
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