ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2023-03-27 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
1.22μm 35.6Mpixel RGB Hybrid Event-Based Vision Sensor with 4.88μm-Pitch Event Pixels and up to 10K Event Frame Rate by Adaptive Control on Event Sparsity Yusuke Sato, Kazutoshi Kodama, Yuhi Yorikado (SSS), Raphael Berner (AVS), Kyoji Mizoguchi, Takahiro Miyazaki, Masahiro Tsukamoto, Yoshihisa Matoba, Hirotaka Shinozaki, Atsumi Niwa, Tetsuji Yamaguchi (SSS), Christian Brandli (AVS), Hayato Wakabaayashi, Yusuke Oike (SSS) |
This paper presents a 1.22μm-pixel 35.6M-pixel RGB hybrid event-based vision sensor. To enhance RGB quality with high-sp... [more] |
IST2023-6 pp.1-4 |
IST |
2020-03-27 17:00 |
Tokyo |
Kikaishinko kaikan (Postponed) |
A 0.5e-rms Noise 1.45um-Pitch CMOS Image Sensor with Reference Shared In-Pixel Differential Amplifier at 8.3Mpixel 35fps Hideki Naganuma, Mamoru Sato, Yuhi Yorikado, Yusuke Matsumura, Eriko Kato, Takuya Toyofuku, Akihiko Kato, Yusuke Oike (SSS) |
We fabricated a 1.45-um pixel, back-illuminated stacked 1/2.8-inch CIS that uses a reference-shared in-pixel differentia... [more] |
IST2020-24 pp.77-80 |
IST |
2018-03-09 13:50 |
Tokyo |
NHK Housou-Gijyutu Lab. |
An Experimental CMOS Photon Detector with 0.5e- RMS Temporal Noise and 15μm pitch Active Sensor Pixels Toshiyuki Nishihara, Matsuo Matsumura,, Tsutomu Imoto, Kenichi Okumura, Yorito Sakano, Yuhi Yorikado, Yoshiaki Tashiro, Hayato Wakabayashi, Yusuke Oike, Yoshikazu Nitta (Sony Semiconductor Solutions) |
This is the first reported non-electron-multiplying CMOS Image Sensor (CIS) photon-detector for replacing Photo Multipli... [more] |
IST2018-19 pp.35-38 |
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|