Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970
[TOP] | [2016] | [2017] | [2018] | [2019] | [2020] | [2021] | [2022] | [Japanese] / [English]
IST2016-42
[Invited Talk]
Accelerating the Sensing World through Imaging Evolution
Satoshi Yoshihara, Tetsuo Nomoto, Yusuke Oike, Hayato Wakabayashi (Sony Semiconductor Solutions)
pp. 1 - 5
IST2016-43
An 8.3M-pixel 480fps Global-Shutter CMOS Image Sensor with Gain-Adaptive Column ADCs and 2-on-1 Stacked Device
Yuri Kato, Yusuke Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, Akihiko Kato, Mamoru Sato, Wataru Nakamura, Hiroshi Shiroshita, Yorito Sakano, Yoshiaki Kitano, Takuya Nakamura, Takayuki Toyama, Hayato Iwamoto, Takayuki Ezaki (Sony)
pp. 7 - 10
IST2016-44
A dead-time free global shutter stacked CMOS image sensor with in-pixel lateral overflow integration capacitor and ADC using pixel-wise direct connections
Rihito Kuroda, Hidetake Sugo, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.)
pp. 11 - 14
IST2016-45
RTS and photon shot noise reduction based on maximum likelihood estimate with a multi-aperture camera and semi-photon-counting-level CMOS image sensors
Haruki Ishida, Keiichiro Kagawa, Min-Woong Seo (Shizuoka Univ.), Takashi Komuro (Saitama Univ.), Bo Zhang, Taishi Takasawa, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.)
pp. 15 - 18
IST2016-46
(See Japanese page.)
pp. 19 - 22
IST2016-47
White Spots Reduction by Ultimate Proximity Metal Gettering at Carbon Complexes Formed underneath Contact Area in CMOS Image Sensors
Tadashi Yamaguchi, Tomohiro Yamashita (Renesas), Takeshi Kamino, Yotaro Goto, Takashi Kuroi (RSMC), Masazumi Matsuura (Renesas)
pp. 23 - 26
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.