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Paper Abstract and Keywords
Presentation 2009-07-24 13:25
Noise measurement of pixel transistors in CMOS image sensor
Toshiaki Yamagishi, Takahiro Kohara, Takafumi Fujisawa, Kenichi Abe, Shigetoshi Sugawa (Tohoku Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) Threshold voltage variation and random noise generated in pixel source follower transistors of a CMOS image sensor have been measured by using an array test circuits consisting of the transistors whose electric contacts of the gate poly-silicon are on the isolation region and on the active region. Moreover, operating condition dependency of the random noise generated by pixel transistors have been measured with a LOFIC CMOS image sensor in which the noise of the readout circuits have reduced to about 0.5e- (input referred). In this paper, these results are discussed.
Keyword (in Japanese) (See Japanese page) 
(in English) CMOS Image Sensor / RTS Noise / Array Test Circuits / / / / /  
Reference Info. ITE Tech. Rep., vol. 33, no. 30, IST2009-37, pp. 5-8, July 2009.
Paper # IST2009-37 
Date of Issue 2009-07-17 (IST) 
ISSN Print edition: ISSN 1342-6893
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Conference Information
Committee IST  
Conference Date 2009-07-24 - 2009-07-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Sensor, etc. 
Paper Information
Registration To IST 
Conference Code 2009-07-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Noise measurement of pixel transistors in CMOS image sensor 
Sub Title (in English)  
Keyword(1) CMOS Image Sensor  
Keyword(2) RTS Noise  
Keyword(3) Array Test Circuits  
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1st Author's Name Toshiaki Yamagishi  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Takahiro Kohara  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Takafumi Fujisawa  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Kenichi Abe  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Shigetoshi Sugawa  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-5 
Date Time 2009-07-24 13:25:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2009-37 
Volume (vol) vol.33 
Number (no) no.30 
Page pp.5-8 
#Pages
Date of Issue 2009-07-17 (IST) 


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