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Paper Abstract and Keywords
Presentation 2009-09-28 13:00
Analysis of Dark Current in 4-Transistor CMOS Imager Pixel with Negative Transfer-gate bias Operation
Hirofumi Yamashita, Motohiro Maeda, Shogo Furuya, Takanori Yagami (Toshiba)
Abstract (in Japanese) (See Japanese page) 
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Reference Info. ITE Tech. Rep., vol. 33, no. 38, IST2009-46, pp. 1-4, Sept. 2009.
Paper # IST2009-46 
Date of Issue 2009-09-21 (IST) 
ISSN Print edition: ISSN 1342-6893
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Conference Information
Committee IST  
Conference Date 2009-09-28 - 2009-09-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To IST 
Conference Code 2009-09-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of Dark Current in 4-Transistor CMOS Imager Pixel with Negative Transfer-gate bias Operation 
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1st Author's Name Hirofumi Yamashita  
1st Author's Affiliation Imaging Device Marketing & Engineering Development Group, Toshiba Corporation (Toshiba)
2nd Author's Name Motohiro Maeda  
2nd Author's Affiliation Imaging Device Marketing & Engineering Development Group, Toshiba Corporation (Toshiba)
3rd Author's Name Shogo Furuya  
3rd Author's Affiliation Imaging Device Marketing & Engineering Development Group, Toshiba Corporation (Toshiba)
4th Author's Name Takanori Yagami  
4th Author's Affiliation Imaging Device Marketing & Engineering Development Group, Toshiba Corporation (Toshiba)
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Date Time 2009-09-28 13:00:00 
Presentation Time 30 minutes 
Registration for IST 
Paper # IST2009-46 
Volume (vol) vol.33 
Number (no) no.38 
Page pp.1-4 
#Pages 4 
Date of Issue 2009-09-21 (IST) 

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