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Paper Abstract and Keywords
Presentation 2010-07-22 10:45
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability
Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo)
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse counter. The proposed circuit monitors the process variability according to a count number of a single pulse which propagates on the buffer ring and a fixed logic level after the pulse vanishes. Using the proposed circuit in combination with a simple ring oscillator which monitors its oscillation period, we can calculate the rise and fall delay values and can monitors the variabilities of PMOS and NMOS devices independently. The experimental results of the circuit simulation on 65nm CMOS process indicate the feasibility of the proposed monitoring circuit. The proposed monitoring technique is suitable not only for the on-chip process variability monitoring but also for the in-field monitoring of aging effects such as negative/positive bias temperature instability (NBTI/PBTI).
Keyword (in Japanese) (See Japanese page) 
(in English) variability / aging effects / on-chip monitor / buffer ring / NBTI / PBTI / /  
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Conference Information
Committee IST IEICE-ICD  
Conference Date 2010-07-22 - 2010-07-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Josho Gakuen Osaka Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To IEICE-ICD 
Conference Code 2010-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability 
Sub Title (in English)  
Keyword(1) variability  
Keyword(2) aging effects  
Keyword(3) on-chip monitor  
Keyword(4) buffer ring  
Keyword(5) NBTI  
Keyword(6) PBTI  
1st Author's Name Tetsuya Iizuka  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Toru Nakura  
2nd Author's Affiliation University of Tokyo (Univ. of Tokyo)
3rd Author's Name Kunihiro Asada  
3rd Author's Affiliation University of Tokyo (Univ. of Tokyo)
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Speaker Author-1 
Date Time 2010-07-22 10:45:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
Paper #  
Volume (vol) vol.34 
Number (no)  
Date of Issue  

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