Conference Information |
Committee |
IST IEICE-ICD |
Conference Date |
2010-07-22 - 2010-07-23 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Josho Gakuen Osaka Center |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
Paper Information |
Registration To |
IEICE-ICD |
Conference Code |
2010-07-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability |
Sub Title (in English) |
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Keyword(1) |
variability |
Keyword(2) |
aging effects |
Keyword(3) |
on-chip monitor |
Keyword(4) |
buffer ring |
Keyword(5) |
NBTI |
Keyword(6) |
PBTI |
Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Tetsuya Iizuka |
1st Author's Affiliation |
University of Tokyo (Univ. of Tokyo) |
2nd Author's Name |
Toru Nakura |
2nd Author's Affiliation |
University of Tokyo (Univ. of Tokyo) |
3rd Author's Name |
Kunihiro Asada |
3rd Author's Affiliation |
University of Tokyo (Univ. of Tokyo) |
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Speaker |
Author-1 |
Date Time |
2010-07-22 10:45:00 |
Presentation Time |
25 minutes |
Registration for |
IEICE-ICD |
Paper # |
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Volume (vol) |
vol.34 |
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