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Technical Committee on Information Sensing (IST) [schedule] [select]
Chair Jun Ohta (NAIST)
Vice Chair Isamu Takayanagi (Aptina), Shigetoshi Sugawa (Tohoku Univ.)
Secretary Masayuki Ikebe (Hokkaido Univ.)

Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [schedule] [select]
Chair Kunio Uchiyama (Hitachi)
Vice Chair Masahiko Yoshimoto (Kobe Univ.), Toshihiko Hamasaki (TI)
Secretary Yoshio Hirose (Fujitsu Labs.), Hiroaki Suzuki (Renesas)
Assistant Toshimasa Matsuoka (Osaka Univ.), Ken Takeuchi (Univ. of Tokyo), Kenichi Okada (Tokyo Inst. of Tech.)

Conference Date Thu, Jul 22, 2010 09:30 - 18:20
Fri, Jul 23, 2010 09:15 - 17:50
Topics Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Conference Place Josho Gakuen Osaka Center 
Transportation Guide http://www.josho.ac.jp/osakacenter/index.html
Contact
Person
Prof. Hiroshi Makino
06-6346-6367 (Hall)
Sponsors This conference is co-sponsored by IEEE SSCS Japan/Kansai Chapter

Thu, Jul 22 AM 
09:30 - 13:00
(1)
IEICE-ICD
09:30-09:55 On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.)
(2)
IEICE-ICD
09:55-10:20 The Minimal Structure of On-Chip Monitoring and Application to Evaluation of Chip Environments Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.)
(3)
IEICE-ICD
10:20-10:45 In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.)
(4)
IEICE-ICD
10:45-11:10 Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo)
  11:10-11:20 Break ( 10 min. )
(5)
IEICE-ICD
11:20-12:10 [Invited Talk]
Digital Calibration and Correction Methods for CMOS-ADCs
Shiro Dosho (Pana)
(6)
IEICE-ICD
12:10-13:00 [Invited Talk]
A 10b 50MS/s 820uW SAR ADC with on-chip digital calibration
Sanroku Tsukamoto (Fujitsu Labs.)
  13:00-14:00 Lunch Break ( 60 min. )
Thu, Jul 22 PM 
14:00 - 18:20
(7)
IEICE-ICD
14:00-14:50 [Invited Talk]
Digitally-Assisted Analog Test Technology
Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.)
(8)
IEICE-ICD
14:50-15:40 [Invited Talk]
Trend in Multi-mode Multi-band transceivers
Hisayasu Sato (Renesas)
  15:40-15:50 Break ( 10 min. )
(9)
IEICE-ICD
15:50-16:40 [Invited Talk]
A 2.1-to-2.8-GHz Low-Phase-Noise All-Digital Frequency Synthesizer with a Time-Windowed Time-to-Digital Converter
Tadashi Maeda, Takashi Tokairin (Renesas), Masaki Kitsunezuka (NEC), Mitsuji Okada (Renesas), Muneo Fukaishi (NEC)
  16:40-16:50 Break ( 10 min. )
(10) 16:50-18:20 Panel Discussion
Fri, Jul 23 AM 
09:15 - 12:20
(11)
IEICE-ICD
09:15-09:40 Implementation of a CMOS Subthreshold Analog Amplifier using 0.5V Power Supply Tomochika Harada (Yamagata Univ.)
(12)
IEICE-ICD
09:40-10:05 OTA Design Using gm/ID Lookup Table Methodology
-- Featuring Settling Time Optimization --
Toru Kashimura, Takayuki Konishi, Shoichi Masui (Tohoku Univ.)
(13)
IEICE-ICD
10:05-10:30 Considerations of a common-mode feedback circuit in the CMOS inverter-based differential amplifier. Masayuki Uno (Linear Cell Design)
(14)
IEICE-ICD
10:30-10:55 The Design of a Gm Amplifier with the Improved Linearity by Using the Positive Feedback Compensation Scheme and its Application to High-frequency Filter Design Yusuke Shimoyama, Yasuhiro Sugimoto (Chuo Univ.)
  10:55-11:05 Break ( 10 min. )
(15)
IEICE-ICD
11:05-11:30 On-chip background calibration of time-interleaved ADC Takashi Oshima, Tomomi Takahashi (Hitachi)
(16)
IST
11:30-11:55 A/D converter for CMOS Image Sensor with a variable gain amplifier features Tetsuya Iida, Tomoyuki Akahori (BT), Mohd Amrallah Bin Mustafa, Keita Yastomi, Shoji Kawahito (Shizuoka Univ.)
(17)
IST
11:55-12:20 Interleaved ramp wave generator for single slope ADC Yukinobu Makihara, Shin Muon, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.)
  12:20-13:20 Lunch Break ( 60 min. )
Fri, Jul 23 PM 
13:20 - 17:50
(18)
IST
13:20-14:10 [Invited Talk]
An All-Digital and Scalable Time-Mode A/D Converter TAD
-- Challenge for Sensor Circuit Digitalization --
Takamoto Watanabe (DENSO)
(19)
IST
14:10-15:00 [Invited Talk]
TDC and SOI Radiation Image Sensor for Particle Physics
Yasuo Arai (KEK IPNS)
  15:00-15:10 Break ( 10 min. )
(20)
IST
15:10-15:35 Low noise sensor signal readout circuits with a response time acceleration technique Mars Kamel, Kawahito Shoji (Shizuoka Univ.)
(21)
IST
15:35-16:00 Design and Development of Polarization-Analyzing Image Sensor using 65nm CMOS Process Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST)
(22)
IEICE-ICD
16:00-16:25 User Customizable Logic Paper with 2V Organic CMOS and Ink-Jet Printed Interconnects Koichi Ishida, Naoki Masunaga, Ryo Takahashi, Tsuyoshi Sekitani (Univ. of Tokyo), higeki Shino (Mitsubishi Paper Mills Ltd.), Ute Zschieschang, Hagen Klauk (Max Planck Institute), Makoto Takamiya, Takao Someya, Takayasu Sakurai (Univ. of Tokyo)
  16:25-16:35 Break ( 10 min. )
(23)
IEICE-ICD
16:35-17:00 Self-Dithered Digital Delta Sigma Modulators for Fractional-N Frequency Synthesizers Zule Xu, Jun Gyu Lee, Shoichi Masui (Tohoku Univ.)
(24)
IEICE-ICD
17:00-17:25 A Study of High-speed Simulation Method for a Buck & Boost DC-DC Converters Masahiro Suzuki (Chuo Univ.), Syoko Sugimoto (AdIn), Yasuhiro Sugimoto (Chuo Univ.)
(25)
IEICE-ICD
17:25-17:50 Level Converter Circuit for Low Voltage Digital LSIs Yuji Osaki, Tetsuya Hirose, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited TalkEach speech will have 40 minutes for presentation and 10 minutes for discussion.

Contact Address and Latest Schedule Information
IST Technical Committee on Information Sensing (IST)   [Latest Schedule]
Contact Address Masayuki Ikebe (Hokkaido University)
TEL 011-706-7689,FAX 011-706-7689
E-:ibeisti 
IEICE-ICD Technical Committee on Integrated Circuits and Devices (IEICE-ICD)   [Latest Schedule]
Contact Address Toshimasa Matsuoka (Osaka University)
TEL 06-6879-7792,FAX 06-6879-7792
E-:eeieng-u 


Last modified: 2010-05-27 18:47:09


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