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Paper Abstract and Keywords
Presentation 2010-07-23 15:35
Design and Development of Polarization-Analyzing Image Sensor using 65nm CMOS Process
Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST)
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Reference Info. ITE Tech. Rep., vol. 34, no. 29, IST2010-41, pp. 111-114, July 2010.
Paper # IST2010-41 
Date of Issue 2010-07-16 (IST) 
ISSN Print edition: ISSN 1342-6893
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Conference Information
Committee IST IEICE-ICD  
Conference Date 2010-07-22 - 2010-07-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Josho Gakuen Osaka Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To IST 
Conference Code 2010-07-IST-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Design and Development of Polarization-Analyzing Image Sensor using 65nm CMOS Process 
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1st Author's Name Sanshiro Shishido  
1st Author's Affiliation NARA INSTITUTE of SCIENCE and TECHNOLOGY (NAIST)
2nd Author's Name Toshihiko Noda  
2nd Author's Affiliation NARA INSTITUTE of SCIENCE and TECHNOLOGY (NAIST)
3rd Author's Name Kiyotaka Sasagawa  
3rd Author's Affiliation NARA INSTITUTE of SCIENCE and TECHNOLOGY (NAIST)
4th Author's Name Takashi Tokuda  
4th Author's Affiliation NARA INSTITUTE of SCIENCE and TECHNOLOGY (NAIST)
5th Author's Name Jun Ohta  
5th Author's Affiliation NARA INSTITUTE of SCIENCE and TECHNOLOGY (NAIST)
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Date Time 2010-07-23 15:35:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2010-41 
Volume (vol) vol.34 
Number (no) no.29 
Page pp.111-114 
#Pages
Date of Issue 2010-07-16 (IST) 


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