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Paper Abstract and Keywords
Presentation 2011-05-27 14:00
[Poster Presentation] Spectrophotometric image sensor with pinholes in the light-shielding metal
Ayaka Mizui, Akio Kitagawa (Kanazawa Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) A spectrophotometric analysis helps us to know the characteristics of the materials. Digital cameras acquire color images by means of a sensor with a color filter array consists in red (R), green (G) and blue (B) filters. Therefore, digital cameras cannot restructure original spectrum of object due to measure only the light intensity of RGB. To restructure spectrum with higher quality, cameras need the function of spectrophotometry. In this work, we show using FDTD simulation that pinholes in the light-shielding metal selects wave of specific wavelength.
Keyword (in Japanese) (See Japanese page) 
(in English) Spectrophotometric / spectrum / pinhole / color reproduction / / / /  
Reference Info. ITE Tech. Rep., vol. 35, no. 19, IST2011-27, pp. 41-43, May 2011.
Paper # IST2011-27 
Date of Issue 2011-05-20 (IST) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2011-05-27 - 2011-05-27 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Paper Information
Registration To IST 
Conference Code 2011-05-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Spectrophotometric image sensor with pinholes in the light-shielding metal 
Sub Title (in English)  
Keyword(1) Spectrophotometric  
Keyword(2) spectrum  
Keyword(3) pinhole  
Keyword(4) color reproduction  
1st Author's Name Ayaka Mizui  
1st Author's Affiliation Kanazawa University (Kanazawa Univ.)
2nd Author's Name Akio Kitagawa  
2nd Author's Affiliation Kanazawa University (Kanazawa Univ.)
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Date Time 2011-05-27 14:00:00 
Presentation Time 60 
Registration for IST 
Paper # ITE-IST2011-27 
Volume (vol) ITE-35 
Number (no) no.19 
Page pp.41-43 
#Pages ITE-3 
Date of Issue ITE-IST-2011-05-20 

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