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Paper Abstract and Keywords
Presentation 2011-07-22 09:25
An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring oscillator. The proposed circuit monitors the PMOS and NMOS process variabilities independently according to a count number of a single pulse which propagates on the ring during the buffer ring mode, and a oscillation frequency during the
ring oscillator mode. Using this shared-ring structure, we reduce the occupation area about 40% without loss of process variability monitoring properties compared with the conventional circuit. The proposed shared-ring circuit has been fabricated in 65nm CMOS process and the measurement results with two different wafer lots show the feasibility of the proposed process variability monitoring scheme.
Keyword (in Japanese) (See Japanese page) 
(in English) process variability / on-chip monitor / buffer ring / all digital / / / /  
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Conference Information
Committee IST IEICE-ICD  
Conference Date 2011-07-21 - 2011-07-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To IEICE-ICD 
Conference Code 2011-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator 
Sub Title (in English)  
Keyword(1) process variability  
Keyword(2) on-chip monitor  
Keyword(3) buffer ring  
Keyword(4) all digital  
1st Author's Name Tetsuya Iizuka  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Kunihiro Asada  
2nd Author's Affiliation University of Tokyo (Univ. of Tokyo)
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Speaker Author-1 
Date Time 2011-07-22 09:25:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
Paper #  
Volume (vol) vol.35 
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Date of Issue  

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