ITE Technical Group Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-07-22 09:25
An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring oscillator. The proposed circuit monitors the PMOS and NMOS process variabilities independently according to a count number of a single pulse which propagates on the ring during the buffer ring mode, and a oscillation frequency during the
ring oscillator mode. Using this shared-ring structure, we reduce the occupation area about 40% without loss of process variability monitoring properties compared with the conventional circuit. The proposed shared-ring circuit has been fabricated in 65nm CMOS process and the measurement results with two different wafer lots show the feasibility of the proposed process variability monitoring scheme.
Keyword (in Japanese) (See Japanese page) 
(in English) process variability / on-chip monitor / buffer ring / all digital / / / /  
Reference Info. ITE Tech. Rep.
Paper #  
Date of Issue  
ISSN  
Download PDF

Conference Information
Committee IST IEICE-ICD  
Conference Date 2011-07-21 - 2011-07-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To IEICE-ICD 
Conference Code 2011-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator 
Sub Title (in English)  
Keyword(1) process variability  
Keyword(2) on-chip monitor  
Keyword(3) buffer ring  
Keyword(4) all digital  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tetsuya Iizuka  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Kunihiro Asada  
2nd Author's Affiliation University of Tokyo (Univ. of Tokyo)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2011-07-22 09:25:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
Paper #  
Volume (vol) vol.35 
Number (no)  
Page  
#Pages  
Date of Issue  

[Return to Top Page]

[Return to ITE Web Page]
The Institute of Image Information and Television Engineers (ITE), Japan