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Paper Abstract and Keywords
Presentation 2013-03-15 13:05
[Invited Talk] A Fast Non-Contact Inspection Method through Phased Array Systems for High Resolution Flat Panel Pattern
Hiroshi Hamori (OHT), Hideki Katagiri (Hiroshima Univ.), Kosuke Kato (HIT)
Abstract (in Japanese) (See Japanese page) 
(in English) The quality of images on flat panels has been improving remarkably in recent years and as a result ultra high definition TVs such as 4K and 8K have become a reality today. However, manufacturers are yet to resolve many problems when a stable product line with a high throughput is considered. As a way of improving production yield, though there is a repair system that can detect electrical defects on normal flat panels in early stages of manufacturing process and repair them, there is still no method to detect defects on ultra high resolution panels. If those defects are not detected on early stages and only detected in the final stage then the panel will become useless. In this paper we propose a non-contact inspection technique based on phased array principle, that detects open circuits and close circuits on wirings of ultra high resolution flat panels and the experimental results reveal that the this method is useful and efficient for detecting electrical defects.
Keyword (in Japanese) (See Japanese page) 
(in English) Electrical Inspection / High Resolution Pattern / Phased array / Non-Contact / / / /  
Reference Info. ITE Tech. Rep., vol. 37, no. 16, IDY2013-16, pp. 1-6, March 2013.
Paper # IDY2013-16 
Date of Issue 2013-03-08 (IDY) 
ISSN Print edition: ISSN 1342-6893
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Conference Information
Committee IDY  
Conference Date 2013-03-15 - 2013-03-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IDY 
Conference Code 2013-03-IDY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Fast Non-Contact Inspection Method through Phased Array Systems for High Resolution Flat Panel Pattern 
Sub Title (in English)  
Keyword(1) Electrical Inspection  
Keyword(2) High Resolution Pattern  
Keyword(3) Phased array  
Keyword(4) Non-Contact  
1st Author's Name Hiroshi Hamori  
1st Author's Affiliation OHT (OHT)
2nd Author's Name Hideki Katagiri  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Kosuke Kato  
3rd Author's Affiliation Hiroshima Institute of Technology (HIT)
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Speaker Author-1 
Date Time 2013-03-15 13:05:00 
Presentation Time 35 minutes 
Registration for IDY 
Paper # IDY2013-16 
Volume (vol) vol.37 
Number (no) no.16 
Page pp.1-6 
Date of Issue 2013-03-08 (IDY) 

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