| Paper Abstract and Keywords |
| Presentation |
2014-07-03 13:55
[Invited Talk]
Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We propose a novel method for characterizing the oxide traps that participate in random telegraph noise (RTN) by using charging history effects on the traps. In this method, the variation in the frequency of the high/low drain current derived from RTN with the charging history is monitored instead of the time-scale parameters that are usually used. Moreover, we also propose a method to determine the number and charging conditions of the traps. These methods are particularly effective for characterizing individual oxide traps in multi-trap RTN. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
MOSFET / Random Telegraph Noise / RTN / Charging History Effect / Oxide Traps / / / |
| Reference Info. |
ITE Tech. Rep., vol. 38, no. 26, IST2014-32, pp. 29-30, July 2014. |
| Paper # |
IST2014-32 |
| Date of Issue |
2014-06-26 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
| Download PDF |
|
| Conference Information |
| Committee |
IST IEICE-ICD |
| Conference Date |
2014-07-03 - 2014-07-04 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
|
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Analog circuit, Mixed signal, RF and sensor I/F. |
| Paper Information |
| Registration To |
IST |
| Conference Code |
2014-07-IST-ICD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs |
| Sub Title (in English) |
|
| Keyword(1) |
MOSFET |
| Keyword(2) |
Random Telegraph Noise |
| Keyword(3) |
RTN |
| Keyword(4) |
Charging History Effect |
| Keyword(5) |
Oxide Traps |
| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Toshiaki Tsuchiya |
| 1st Author's Affiliation |
Shimane University (Shimane Univ.) |
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| Speaker |
1 |
| Date Time |
2014-07-03 13:55:00 |
| Presentation Time |
50 |
| Registration for |
IST |
| Paper # |
ITE-IST2014-32 |
| Volume (vol) |
ITE-38 |
| Number (no) |
no.26 |
| Page |
pp.29-30 |
| #Pages |
ITE-2 |
| Date of Issue |
ITE-IST-2014-06-26 |