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Paper Abstract and Keywords
Presentation 2016-08-03 14:15
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs
Yasuhiro Ogasahara, Hanpei Koike (AIST)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new structure devices on ultra-low voltage circuits. Our simulation results based on PTM 22nm model clarify applicability of ultra-low voltage operation to a nominal speed common SoC designs by an introduction of Vth control as well as low power sensor nodes. We also reveal requirement of process variability suppression for high energy efficiency with steep SS transistors.
Keyword (in Japanese) (See Japanese page) 
(in English) process variability / adaptive body bias / ultra-low voltage circuits / energy efficiency / / / /  
Reference Info. ITE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2016-08-01 - 2016-08-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Central Electric Club 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To IEICE-ICD 
Conference Code 2016-08-ICD-SDM-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs 
Sub Title (in English)  
Keyword(1) process variability  
Keyword(2) adaptive body bias  
Keyword(3) ultra-low voltage circuits  
Keyword(4) energy efficiency  
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1st Author's Name Yasuhiro Ogasahara  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Hanpei Koike  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker
Date Time 2016-08-03 14:15:00 
Presentation Time 25 
Registration for IEICE-ICD 
Paper #  
Volume (vol) 40 
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