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Presentation 2018-12-25 13:45
Effect of Ar-cluster irradiation on DNA/Si-MOSFET
Hibiki Nakano, Naoto Mastuo, Akira Heya, Kazushige Yamana, Tadao Takada, Kousuke Moritani, Norio Inui, Yu Sato (Univ. Hyogo), Tadashi Sato, Shin Yokoyama (Hiroshima Univ.)
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Conference Information
Committee IEICE-EID IEICE-SDM IDY  
Conference Date 2018-12-25 - 2018-12-25 
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Paper Information
Registration To IEICE-SDM 
Conference Code 2018-12-EID-SDM-IDY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Effect of Ar-cluster irradiation on DNA/Si-MOSFET 
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1st Author's Name Hibiki Nakano  
1st Author's Affiliation University of Hyogo (Univ. Hyogo)
2nd Author's Name Naoto Mastuo  
2nd Author's Affiliation University of Hyogo (Univ. Hyogo)
3rd Author's Name Akira Heya  
3rd Author's Affiliation University of Hyogo (Univ. Hyogo)
4th Author's Name Kazushige Yamana  
4th Author's Affiliation University of Hyogo (Univ. Hyogo)
5th Author's Name Tadao Takada  
5th Author's Affiliation University of Hyogo (Univ. Hyogo)
6th Author's Name Kousuke Moritani  
6th Author's Affiliation University of Hyogo (Univ. Hyogo)
7th Author's Name Norio Inui  
7th Author's Affiliation University of Hyogo (Univ. Hyogo)
8th Author's Name Yu Sato  
8th Author's Affiliation University of Hyogo (Univ. Hyogo)
9th Author's Name Tadashi Sato  
9th Author's Affiliation Hiroshima University (Hiroshima Univ.)
10th Author's Name Shin Yokoyama  
10th Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Date Time 2018-12-25 13:45:00 
Presentation Time 15 minutes 
Registration for IEICE-SDM 
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Volume (vol) vol.42 
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