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Paper Abstract and Keywords
Presentation 2019-03-22 09:00
0.68e rms RandomNoise 121dB DynamicRange Sub pixel architecture CMOS Image Sensor with LED Flicker Mitigation
Mizuno Hiroyuki, Satoko Iida, Yorito Sakano, Tomohiko Asatsuma (SSS), Masashi Takami (SCK), Ippei Yoshiba, Nobuyuki Ohba, Takumi Oka, Kazunori Yamaguchi, Atsushi Suzuki, Keita Suzuki, Manabu Yamada, Yasushi Tateshita, Keiichi Ohno (SSS)
Abstract (in Japanese) (See Japanese page) 
(in English) This is a report of a CMOS image sensor with a sub-pixel architecture having a pixel pitch of 3 µm. The aforementioned sensor achieves both ultra-low random noise of 0.68e-rms and high dynamic range of 121 dB in a single exposure, further realizing LED flicker mitigation.
Keyword (in Japanese) (See Japanese page) 
(in English) CMOS Image Sensor / Dynamic Rang / Low Noise / LED flicker Mitigation / Single Exposure / / /  
Reference Info. ITE Tech. Rep., vol. 43, no. 11, IST2019-12, pp. 1-6, March 2019.
Paper # IST2019-12 
Date of Issue 2019-03-15 (IST) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2019-03-22 - 2019-03-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image Sensors, etc. 
Paper Information
Registration To IST 
Conference Code 2019-03-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 0.68e rms RandomNoise 121dB DynamicRange Sub pixel architecture CMOS Image Sensor with LED Flicker Mitigation 
Sub Title (in English)  
Keyword(1) CMOS Image Sensor  
Keyword(2) Dynamic Rang  
Keyword(3) Low Noise  
Keyword(4) LED flicker Mitigation  
Keyword(5) Single Exposure  
1st Author's Name Mizuno Hiroyuki  
1st Author's Affiliation Sony Semiconductor Solutions Corp. (SSS)
2nd Author's Name Satoko Iida  
2nd Author's Affiliation SonySemiconductorSolutions (SSS)
3rd Author's Name Yorito Sakano  
3rd Author's Affiliation SonySemiconductorSolutions (SSS)
4th Author's Name Tomohiko Asatsuma  
4th Author's Affiliation SonySemiconductorSolutions (SSS)
5th Author's Name Masashi Takami  
5th Author's Affiliation SonySemiconductorManufacturing (SCK)
6th Author's Name Ippei Yoshiba  
6th Author's Affiliation SonySemiconductorSolutions (SSS)
7th Author's Name Nobuyuki Ohba  
7th Author's Affiliation SonySemiconductorSolutions (SSS)
8th Author's Name Takumi Oka  
8th Author's Affiliation SonySemiconductorSolutions (SSS)
9th Author's Name Kazunori Yamaguchi  
9th Author's Affiliation SonySemiconductorSolutions (SSS)
10th Author's Name Atsushi Suzuki  
10th Author's Affiliation SonySemiconductorSolutions (SSS)
11th Author's Name Keita Suzuki  
11th Author's Affiliation SonySemiconductorSolutions (SSS)
12th Author's Name Manabu Yamada  
12th Author's Affiliation SonySemiconductorSolutions (SSS)
13th Author's Name Yasushi Tateshita  
13th Author's Affiliation SonySemiconductorSolutions (SSS)
14th Author's Name Keiichi Ohno  
14th Author's Affiliation SonySemiconductorSolutions (SSS)
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Speaker Author-1 
Date Time 2019-03-22 09:00:00 
Presentation Time 30 minutes 
Registration for IST 
Paper # IST2019-12 
Volume (vol) vol.43 
Number (no) no.11 
Page pp.1-6 
Date of Issue 2019-03-15 (IST) 

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