Conference Information |
Committee |
IDY IEICE-EID IEIJ-SSL SID-JC IEE-EDD |
Conference Date |
2020-01-23 - 2020-01-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tottori Univ |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
IEICE-EID |
Conference Code |
2020-01-EID-IDY-SSL-JC-EDD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Physical properties of anodized aluminum oxide for low temperature processed IGZO thin-film transistors. |
Sub Title (in English) |
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Keyword(1) |
InGaZnO(IGZO) |
Keyword(2) |
Aluminum oxide |
Keyword(3) |
anodization |
Keyword(4) |
Thin Film Transistor (TFT) |
Keyword(5) |
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Keyword(6) |
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Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Kono Shuya |
1st Author's Affiliation |
Kochi University Of Technology (KUT) |
2nd Author's Name |
Mori Marin |
2nd Author's Affiliation |
Kochi University Of Technology (KUT) |
3rd Author's Name |
Koretomo Daichi |
3rd Author's Affiliation |
Kochi University Of Technology (KUT) |
4th Author's Name |
Furuta Mamoru |
4th Author's Affiliation |
Kochi University Of Technology (KUT) |
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Speaker |
Author-1 |
Date Time |
2020-01-24 11:10:00 |
Presentation Time |
5 minutes |
Registration for |
IEICE-EID |
Paper # |
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Volume (vol) |
vol.44 |
Number (no) |
no.1 |
Page |
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#Pages |
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Date of Issue |
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