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Presentation 2020-12-02 10:00
Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects
Ryo Sumida, Ayata Kurasaki, Mutumi Kimura (RU)
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Conference Information
Committee IEICE-EID IEICE-SDM IDY  
Conference Date 2020-12-02 - 2020-12-02 
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Paper Information
Registration To IEICE-EID 
Conference Code 2020-12-EID-SDM-IDY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects 
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1st Author's Name Ryo Sumida  
1st Author's Affiliation Ryukoku University (RU)
2nd Author's Name Ayata Kurasaki  
2nd Author's Affiliation Ryukoku University (RU)
3rd Author's Name Mutumi Kimura  
3rd Author's Affiliation Ryukoku University (RU)
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Date Time 2020-12-02 10:00:00 
Presentation Time 15 minutes 
Registration for IEICE-EID 
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Volume (vol) vol.44 
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