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Presentation 2020-12-02 11:40
Evaluation of dielectric properties of ferroelectric thin films for neural networks
Yuma Ishisaki, Hiroki Umemura, Daiki Matsukawa, Mutsumi Kimura (RU), Eisuke Tokumitsu (JAIST), Kenichi Haga, Toshihiro Doi (MMC)
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Conference Information
Conference Date 2020-12-02 - 2020-12-02 
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Paper Information
Registration To IEICE-EID 
Conference Code 2020-12-EID-SDM-IDY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of dielectric properties of ferroelectric thin films for neural networks 
Sub Title (in English)  
1st Author's Name Yuma Ishisaki  
1st Author's Affiliation Ryukoku University (RU)
2nd Author's Name Hiroki Umemura  
2nd Author's Affiliation Ryukoku University (RU)
3rd Author's Name Daiki Matsukawa  
3rd Author's Affiliation Ryukoku University (RU)
4th Author's Name Mutsumi Kimura  
4th Author's Affiliation Ryukoku University (RU)
5th Author's Name Eisuke Tokumitsu  
5th Author's Affiliation Japan Advanced Institute of Science and Technology (JAIST)
6th Author's Name Kenichi Haga  
6th Author's Affiliation Mitsubishi Materials Corporation (MMC)
7th Author's Name Toshihiro Doi  
7th Author's Affiliation Mitsubishi Materials Corporation (MMC)
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Speaker Author-1 
Date Time 2020-12-02 11:40:00 
Presentation Time 15 minutes 
Registration for IEICE-EID 
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Volume (vol) vol.44 
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