Paper Abstract and Keywords |
Presentation |
2021-06-30 10:30
A investigation of jitter reduction method using dual reference plane sampling for high range resolution TOF sensor Tatsuki Furuhashi, Keita Yasutomi, Ryosuke Hatada, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In order to obtain extremely high range resolution in the time-of-flight(TOF) range imaging, jitter reduction induced in a trigger jitter of light source and gate drivers is indispensable. In this study, we have proposed dual-reference-plane-sampling (DRPS) for jitter reduction. The jitters induced in the light source and gate drivers are extracted using column-wise and row-wise reference pixels. In this paper, the effectiveness of DRPS is discussed with measurement results using a principle verifier. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
CMOS image sensor (CIS) / time-of-flight(TOF) / high range resolution / trigger jitter of light source and gate driver / reference plane sampling(RPS) / lateral electric field modulator(LEFM) / dual reference plane sampling(DRPS) / |
Reference Info. |
ITE Tech. Rep., vol. 45, no. 17, IST2021-31, pp. 5-8, June 2021. |
Paper # |
IST2021-31 |
Date of Issue |
2021-06-23 (IST) |
ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
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