Paper Abstract and Keywords |
Presentation |
2022-12-12 14:20
[Poster Presentation]
Light-induced reliability issue of NMOS using in CMOS image sensor and single-photon avalanche diode Chun-Hsien Liu, Sheng. Di. Lin (Institute of Electronics, NYCU) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We present the NMOS reliability issue of increased off-current after white-light illumination. Experimental results suggest that light-induce hot electrons generated interface trap states. Enlarged off-current activated the parasitic bipolar-junction transistor. This reliability issue could be prevented with inversion layer forming in channel under a proper bias condition. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
light-induced reliability / parasitic BJT action / CMOS image sensor / single-photon avalanche diode (SPAD) / transistor degradation / / / |
Reference Info. |
ITE Tech. Rep., vol. 46, no. 41, IST2022-52, pp. 39-40, Dec. 2022. |
Paper # |
IST2022-52 |
Date of Issue |
2022-12-05 (IST) |
ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
Download PDF |
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Conference Information |
Committee |
IST |
Conference Date |
2022-12-12 - 2022-12-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Sanaru Hall |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
5th International Workshop on Image Sensors and Imaging Systems (IWISS2022) |
Paper Information |
Registration To |
IST |
Conference Code |
2022-12-IST |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Light-induced reliability issue of NMOS using in CMOS image sensor and single-photon avalanche diode |
Sub Title (in English) |
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Keyword(1) |
light-induced reliability |
Keyword(2) |
parasitic BJT action |
Keyword(3) |
CMOS image sensor |
Keyword(4) |
single-photon avalanche diode (SPAD) |
Keyword(5) |
transistor degradation |
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1st Author's Name |
Chun-Hsien Liu |
1st Author's Affiliation |
Institute of Electronics, National Yang Ming Chiao Tung Universi (Institute of Electronics, NYCU) |
2nd Author's Name |
Sheng. Di. Lin |
2nd Author's Affiliation |
Institute of Electronics, National Yang Ming Chiao Tung Universi (Institute of Electronics, NYCU) |
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Speaker |
Author-1 |
Date Time |
2022-12-12 14:20:00 |
Presentation Time |
90 minutes |
Registration for |
IST |
Paper # |
IST2022-52 |
Volume (vol) |
vol.46 |
Number (no) |
no.41 |
Page |
pp.39-40 |
#Pages |
2 |
Date of Issue |
2022-12-05 (IST) |