| Paper Abstract and Keywords |
| Presentation |
2022-12-12 14:20
[Poster Presentation]
Light-induced reliability issue of NMOS using in CMOS image sensor and single-photon avalanche diode
Chun-Hsien Liu, Sheng. Di. Lin (Institute of Electronics, NYCU) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We present the NMOS reliability issue of increased off-current after white-light illumination. Experimental results suggest that light-induce hot electrons generated interface trap states. Enlarged off-current activated the parasitic bipolar-junction transistor. This reliability issue could be prevented with inversion layer forming in channel under a proper bias condition. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
light-induced reliability / parasitic BJT action / CMOS image sensor / single-photon avalanche diode (SPAD) / transistor degradation / / / |
| Reference Info. |
ITE Tech. Rep., vol. 46, no. 41, IST2022-52, pp. 39-40, Dec. 2022. |
| Paper # |
IST2022-52 |
| Date of Issue |
2022-12-05 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
| Download PDF |
|
| Conference Information |
| Committee |
IST |
| Conference Date |
2022-12-12 - 2022-12-13 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Sanaru Hall |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
5th International Workshop on Image Sensors and Imaging Systems (IWISS2022) |
| Paper Information |
| Registration To |
IST |
| Conference Code |
2022-12-IST |
| Language |
English |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Light-induced reliability issue of NMOS using in CMOS image sensor and single-photon avalanche diode |
| Sub Title (in English) |
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| Keyword(1) |
light-induced reliability |
| Keyword(2) |
parasitic BJT action |
| Keyword(3) |
CMOS image sensor |
| Keyword(4) |
single-photon avalanche diode (SPAD) |
| Keyword(5) |
transistor degradation |
| Keyword(6) |
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| Keyword(7) |
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| 1st Author's Name |
Chun-Hsien Liu |
| 1st Author's Affiliation |
Institute of Electronics, National Yang Ming Chiao Tung Universi (Institute of Electronics, NYCU) |
| 2nd Author's Name |
Sheng. Di. Lin |
| 2nd Author's Affiliation |
Institute of Electronics, National Yang Ming Chiao Tung Universi (Institute of Electronics, NYCU) |
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| Speaker |
Author-1 |
| Date Time |
2022-12-12 14:20:00 |
| Presentation Time |
90 minutes |
| Registration for |
IST |
| Paper # |
IST2022-52 |
| Volume (vol) |
vol.46 |
| Number (no) |
no.41 |
| Page |
pp.39-40 |
| #Pages |
2 |
| Date of Issue |
2022-12-05 (IST) |