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Paper Abstract and Keywords
Presentation
2026-08-04 10:45
Gate-length dependence of subthreshold slope in cryogenic operation of MOSFETs
Takumi Katori
(
AIST/TDU
),
Hidehiro Asai
,
Hiroshi Oka
,
Kimihiko Kato
,
Takumi Inaba
,
Yuika Kobayashi
,
Takashi Nakayama
(
AIST
),
Satoshi Moriyama
(
TDU
),
Takahiro Mori
(
AIST
)
Abstract
(in Japanese)
(See Japanese page)
(in English)
(Not available yet)
Keyword
(in Japanese)
(See Japanese page)
(in English)
/ / / / / / /
Reference Info.
ITE Tech. Rep.
Paper #
Date of Issue
ISSN
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Conference Information
Committee
IEICE-ICD IEICE-SDM IST
Conference Date
2026-08-04 - 2026-08-06
Place (in Japanese)
(See Japanese page)
Place (in English)
Hokkaido Univ, Pharmaceutical Sciences, Lecture Room 2
Topics (in Japanese)
(See Japanese page)
Topics (in English)
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications
Paper Information
Registration To
IEICE-SDM
Conference Code
2026-08-ICD-SDM-IST
Language
Japanese
Title (in Japanese)
(See Japanese page)
Sub Title (in Japanese)
(See Japanese page)
Title (in English)
Gate-length dependence of subthreshold slope in cryogenic operation of MOSFETs
Sub Title (in English)
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1st Author's Name
Takumi Katori
1st Author's Affiliation
National Institute of Advanced Industrial Science and Technology, Tokyo Denki University
(
AIST/TDU
)
2nd Author's Name
Hidehiro Asai
2nd Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
3rd Author's Name
Hiroshi Oka
3rd Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
4th Author's Name
Kimihiko Kato
4th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
5th Author's Name
Takumi Inaba
5th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
6th Author's Name
Yuika Kobayashi
6th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
7th Author's Name
Takashi Nakayama
7th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
8th Author's Name
Satoshi Moriyama
8th Author's Affiliation
Tokyo Denki University
(
TDU
)
9th Author's Name
Takahiro Mori
9th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
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Speaker
Author-1
Date Time
2026-08-04 10:45:00
Presentation Time
25 minutes
Registration for
IEICE-SDM
Paper #
Volume (vol)
vol.
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Page
#Pages
Date of Issue
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