| Paper Abstract and Keywords |
| Presentation |
2026-08-24 13:45
Improving PaDiM for Micro-Defect Detection by Selective Enhancement of High-Frequency Components
Yuto Kamiya, Naoki Ota, Naoki Murakami, Naoto Hiramatsu, Shuichi Akizuki, Manabu Hashimoto (Chykyo Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
PaDiM is an anomaly detection method that uses only normal images for training. However, small defects are mixed with normal features during CNN-based feature extraction because of their small size. As a result, defect features are not well preserved, and the detection accuracy decreases. In this study, we focus on the fact that micro-defects contain many high-frequency components. Before feature extraction, we apply a preprocessing method that enhances the high-frequency components of defects while reducing those of the background texture. This helps preserve defect features in the feature extractor and improves anomaly detection accuracy. Experiments on a micro-defect dataset based on the MVTec AD dataset showed that the false negative rate (Image-FNR) for defect images with a diameter of 7 pixels decreased from 16.1% to 8.4%, an improvement of 7.7%. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Visual inspection / Anomaly Detection / Micro-defect / PaDiM / / / / |
| Reference Info. |
ITE Tech. Rep., vol. 50, pp. 9-12, Aug. 2026. |
| Paper # |
|
| Date of Issue |
2026-08-17 (ME) |
| ISSN |
Online edition: ISSN 2424-1970 |
| Download PDF |
|
| Conference Information |
| Committee |
ME JSPE-IAIP |
| Conference Date |
2026-08-24 - 2026-08-25 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Nagoya Kasadera Hotel |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
JSPE-IAIP |
| Conference Code |
2026-08-ME-IAIP |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Improving PaDiM for Micro-Defect Detection by Selective Enhancement of High-Frequency Components |
| Sub Title (in English) |
|
| Keyword(1) |
Visual inspection |
| Keyword(2) |
Anomaly Detection |
| Keyword(3) |
Micro-defect |
| Keyword(4) |
PaDiM |
| Keyword(5) |
|
| Keyword(6) |
|
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Yuto Kamiya |
| 1st Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 2nd Author's Name |
Naoki Ota |
| 2nd Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 3rd Author's Name |
Naoki Murakami |
| 3rd Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 4th Author's Name |
Naoto Hiramatsu |
| 4th Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 5th Author's Name |
Shuichi Akizuki |
| 5th Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 6th Author's Name |
Manabu Hashimoto |
| 6th Author's Affiliation |
Chykyo University (Chykyo Univ.) |
| 7th Author's Name |
|
| 7th Author's Affiliation |
() |
| 8th Author's Name |
|
| 8th Author's Affiliation |
() |
| 9th Author's Name |
|
| 9th Author's Affiliation |
() |
| 10th Author's Name |
|
| 10th Author's Affiliation |
() |
| 11th Author's Name |
|
| 11th Author's Affiliation |
() |
| 12th Author's Name |
|
| 12th Author's Affiliation |
() |
| 13th Author's Name |
|
| 13th Author's Affiliation |
() |
| 14th Author's Name |
|
| 14th Author's Affiliation |
() |
| 15th Author's Name |
|
| 15th Author's Affiliation |
() |
| 16th Author's Name |
|
| 16th Author's Affiliation |
() |
| 17th Author's Name |
|
| 17th Author's Affiliation |
() |
| 18th Author's Name |
|
| 18th Author's Affiliation |
() |
| 19th Author's Name |
|
| 19th Author's Affiliation |
() |
| 20th Author's Name |
|
| 20th Author's Affiliation |
() |
| 21st Author's Name |
|
| 21st Author's Affiliation |
() |
| 22nd Author's Name |
|
| 22nd Author's Affiliation |
() |
| 23rd Author's Name |
|
| 23rd Author's Affiliation |
() |
| 24th Author's Name |
|
| 24th Author's Affiliation |
() |
| 25th Author's Name |
|
| 25th Author's Affiliation |
() |
| 26th Author's Name |
/ / |
| 26th Author's Affiliation |
()
() |
| 27th Author's Name |
/ / |
| 27th Author's Affiliation |
()
() |
| 28th Author's Name |
/ / |
| 28th Author's Affiliation |
()
() |
| 29th Author's Name |
/ / |
| 29th Author's Affiliation |
()
() |
| 30th Author's Name |
/ / |
| 30th Author's Affiliation |
()
() |
| 31st Author's Name |
/ / |
| 31st Author's Affiliation |
()
() |
| 32nd Author's Name |
/ / |
| 32nd Author's Affiliation |
()
() |
| 33rd Author's Name |
/ / |
| 33rd Author's Affiliation |
()
() |
| 34th Author's Name |
/ / |
| 34th Author's Affiliation |
()
() |
| 35th Author's Name |
/ / |
| 35th Author's Affiliation |
()
() |
| 36th Author's Name |
/ / |
| 36th Author's Affiliation |
()
() |
| Speaker |
Author-1 |
| Date Time |
2026-08-24 13:45:00 |
| Presentation Time |
75 minutes |
| Registration for |
JSPE-IAIP |
| Paper # |
ME2026-57 |
| Volume (vol) |
vol.50 |
| Number (no) |
no.23 |
| Page |
pp.9-12 |
| #Pages |
4 |
| Date of Issue |
2026-08-17 (ME) |